Call Us Now! (03) 9874 firstname.lastname@example.org
Applied Measurement Australia Pty Ltd (AMA Pty Ltd) is proud to announce that it supplied Metro Trains with the RIFTEK measurement instruments to monitor railway transportation.
AMA Pty Ltd spent several months demonstrating and training maintenance crew on the use and benefits of the RIFTEK measurement instruments for railway transportation.
This range consists of a variety of profilometers to measure the full profile of a rail wheel flange including the thickness, slope, height, rim/tire thickness as well as measuring the full profile of the wheel roll surface.
The laser profilometer is employed for measuring geometrical parameters of the rail wheel flange (thickness, slope, height), rim/tire thickness and for taking full profile of the wheel roll surface. The device is supplied with database and software package for wheel sets wear data storage and processing.
The IDK series is designed for measuring wheel rolling circle diameter. Measurements are made directly on rolling stock without wheel set roll-out. The measurement of the diameter is performed according to the “three points” technique, without the complete wheel coverage. The gauge contains numeric display to show the value of the wheel diameter. IDK-BT gauge contains Bluetooth interface for transfer results into wheel-set wear database management system.
The IKD series is a PDA based handheld instrument that is employed for laser scanning and measurement of brake disks wear parameters. The device is supplied with database and software package for disks wear data storage and processing. This range included the wheel mounted and axel mounted bisk brake profilometers.
To view the RIFTEK product range, refer to the link or download the RIFTEK product catalogue
For a further discussion contact our Melbourne office by email or phone: +61 3 9874 5777
Since 1976, Applied Measurement
Australia Pty. Ltd. has taken pride in
providing innovative and effective
solutions for applications that involve
measurement of physical parameters.